Publications

  1. "A Multiple Fault Injection Methodology based on Cone Partitioning towards RTL Modeling of Laser Attacks", A. Papadimitriou, D. Hély, V. Beroulle, P. Maistri, R. Leveugle, Design, Automation and Test in Europe Conference (DATE), 2014
  2. "On error models for RTL security evaluations", P. Vanhauwaert, P. Maistri, R. Leveugle, A. Papadimitriou, D. Hély, V. Beroulle, 9th International Conference on Design & Technology of Integrated Systems in Nanoscale Era" (DTIS), 2014
  3. "Layout-Aware Laser Fault Injection Simulation and Modeling: from physical level to gate level", L. Feng, M.L. Flottes, B. Rouzeyre, G. Hubert, 9th International Conference on Design & Technology of Integrated Systems in Nanoscale Era" (DTIS), 2014
  4. "Laser attacks on integrated circuits: from CMOS to FDSOI" J.-M. Dutertre, S. De Castro, A. Sarafianos, N. Boher, Ph. Candelier, J. Damiens, M.-L. Flottes, M. Lisart, G. Di Natale, B. Rouzeyre, 9th International Conference on Design & Technology of Integrated Systems in Nanoscale Era" (DTIS), 2014
  5. "FPGA Emulation of Laser Attacks Against Secure Deep Submicron Integrated Circuits" A. Papadimitriou , D. Hély, V. Beroulle, P. Maistri, R. Leveugle, LCIS and TIMA, Colloque GDR SOC-SIP 10-12 juin 2013 and in Second Workshop on Trustworthy Manufacturing and Utilization of Secure Devices (TRUDEVICE 2014), Paderborn, Germany, May 29-30, 2014
  6. "tLIFTING: an Open-Source Multi-Level Fault Simulator for Ionizing Effects" Feng Lu, Giorgio Di Natale, Marie-Lise Flottes and Bruno Rouzeyre. Conférence PRIME 2013, 9th Conference on Ph. D. Research in Microelectronics and Electronics, Villach, Austria, June 24th-27th, 2013
  7. "Laser-Induced Fault Simulation" Feng Lu, Giorgio Di Natale, Marie-Lise Flottes, Bruno Rouzeyre, conference DSD 2013, Santander, Spain, Sept. 4-6, 2013
  8. "Multi-Level Laser-Induced Fault Simulation", Feng Lu, Colloque GDR SOC-SIP 10-12 juin 2013
  9. "Simulating Laser Effects on ICs, from Physical Level to Gate Level: a Comprehensive Approach" F. Lu, G. Di Natale, M.-L. Flottes, B. Rouzeyre, G. Hubert, WORSHOP TRUDEVICE 2014, Paderborn, Germany,  May 29th-30th, 
  10. "Customized Cell Detector for Laser-Induced-Fault Detection", Feng LU, Giorgio DI NATALE , Marie-Lise FLOTTES , Bruno ROUZEYRE , 20th IEEE International On-Line Testing Symposium, Spain July 7-9, 2014
  11. "Laser-induced Fault Effects in Security-dedicated Circuits" R. Leveugle, P. Maistri, P. Vanhauwaert, F. Lu, G. Di Natale, M.-L. Flottes, B. Rouzeyre, A. Papadimitriou, D. Hély, V. Beroulle, G. Hubert, S. De Castro, J.-M. Dutertre, A. Sarafianos, N. Boher, M. Lisart, J. Damiens, P. Candelier, C. Tavernier, IEEE/IPI VLSI-SoC conference 2014, October 6-8, 2014, Playa del Carmen, Mexico, 

  12. "Analysis of Laser-Induce Errors: RTL Fault Model Versus Layout Locality Characteristics" A. Papadimitriou*, D. Hély*, V. Beroulle*, P. Maistri, R. Leveugle. Accepted Third Workshop on Trustworthy Manufacturing and Utilization of Secure Devices (TRUDEVICE 2015), Grenoble, France, March 13, 2015